Raman and IR spectra of pure and doped forsterite single crystals

Abstract

Forsterite single crystals were grown by the Czochralski technique in air. The lattice parameters were determined by X-ray power diffraction. The IR and Raman spectra of pure and doped (V3+, V5+, and Ni4+) Mg2SiO4 single crystals were measured at room temperature. We studied the phonon properties and discussed the influence of dopants.

Keywords

• forsterite
• x-Ray diffraction
• IR spectra
• Raman spectra
• optical properties